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Anne L'Huillier

Anne l'Huillier

Professor

Anne L'Huillier

Monolithic single-shot dispersion-scan : A new tool for real-time measurement and optimization of femtosecond pulses

Author

  • Francisco Silva
  • I´ñigo J. Sola
  • Helder Crespo
  • Rosa Romero
  • Miguel Miranda
  • Cord L. Arnold
  • Anne L'Huillier
  • Jose Trull
  • Crina Cojocaru

Summary, in English

The precise characterization of femtosecond laser pulses is as challenging as their generation and a topic of intense research. Dispersion-scan (d-scan) [1] is a recently established technique where the spectrum of a nonlinear signal, e.g., second-harmonic generation (SHG), is measured as a function of dispersion applied to the pulse. The spectral phase of the pulse can then be retrieved from the resulting 2D trace using an iterative algorithm. An important implementation of d-scan, based on a chirped mirror and wedge compressor, involves progressively moving one of the wedges around the maximum compression point and acquiring the resulting SHG spectrum for each insertion with a standard spectrometer. This robust and fully inline approach, which does not require any beamsplitting or temporal delays, has enabled the simultaneous compression and measurement of pulses down to single-cycle durations [2-4], but its scanning nature precludes single-shot operation. A single-shot d-scan variant that explores the spatially dependent dispersion of a glass prism was successfully demonstrated with 3.2 fs pulses [5], but the relatively small amount of dispersion that can be introduced by a single prism limits its use to few-cycle pulses.

Department/s

  • Atomic Physics

Publishing year

2017

Language

English

Publication/Series

The European Conference on Lasers and Electro-Optics, CLEO_Europe 2017

Document type

Conference paper

Publisher

Institute of Electrical and Electronics Engineers Inc.

Topic

  • Atom and Molecular Physics and Optics

Conference name

The European Conference on Lasers and Electro-Optics, CLEO_Europe 2017

Conference date

2017-06-25 - 2017-06-29

Conference place

Munich, Germany

Status

Published

ISBN/ISSN/Other

  • ISBN: 978-1-5090-6736-7