XUV interferometry using high-order harmonics: Application to plasma diagnostics

Summary, in English

In this paper, we present and compare the two different XUV interferometric techniques using high-order harmonics that have been developed so far. The first scheme is based on the interference between two spatially separated phase-locked harmonic sources while the second uses two temporally separated harmonic sources. These techniques have been applied to plasma diagnostics in feasibility experiments where electron densities up to a few 1020 e[minus sign/cm3 have been measured with a temporal resolution of 200 fs. We present the main characteristics of each technique and discuss their respective potentials and limitations.