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Anne L'Huillier

Anne l'Huillier

Professor

Anne L'Huillier

Photoemission electron microscopy using extreme ultraviolet attosecond pulse trains

Author

  • Anders Mikkelsen
  • Jörg Schwenke
  • Thomas Fordell
  • Gang Luo
  • Kathrin Klünder
  • Emelie Hilner
  • Nicklas Anttu
  • Alexei Zakharov
  • Edvin Lundgren
  • Johan Mauritsson
  • Jesper N Andersen
  • Hongqi Xu
  • Anne L'Huillier

Summary, in English

We report the first experiments carried out on a new imaging setup, which combines the high spatial resolution of a photoemission electron microscope (PEEM) with the temporal resolution of extreme ultraviolet (XUV) attosecond pulse trains. The very short pulses were provided by high-harmonic generation and used to illuminate lithographic structures and Au nanoparticles, which, in turn, were imaged with a PEEM resolving features below 300 nm. We argue that the spatial resolution is limited by the lack of electron energy filtering in this particular demonstration experiment. Problems with extensive space charge effects, which can occur due to the low probe pulse repetition rate and extremely short duration, are solved by reducing peak intensity while maintaining a sufficient average intensity to allow imaging. Finally, a powerful femtosecond infrared (IR) beam was combined with the XUV beam in a pump-probe setup where delays could be varied from subfemtoseconds to picoseconds. The IR pump beam could induce multiphoton electron emission in resonant features on the surface. The interaction between the electrons emitted by the pump and probe pulses could be observed. (C) 2009 American Institute of Physics. [doi:10.1063/1.3263759]

Department/s

  • Synchrotron Radiation Research
  • MAX IV Laboratory
  • Atomic Physics
  • Solid State Physics

Publishing year

2009

Language

English

Publication/Series

Review of Scientific Instruments

Volume

80

Issue

12

Document type

Journal article

Publisher

American Institute of Physics (AIP)

Topic

  • Atom and Molecular Physics and Optics

Status

Published

ISBN/ISSN/Other

  • ISSN: 1089-7623