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Portrait of Arkady Yartsev. Photo: Kennet Ruona

Arkady Yartsev

Researcher

Portrait of Arkady Yartsev. Photo: Kennet Ruona

Transient photocurrent of bulk heterojunction solar cell characterized by ns-laser and sub-ms LED

Author

  • Yingyot Infahsaeng
  • Daniele Danna
  • Zheng Tang
  • Torbjörn Pascher
  • Olle Inganas
  • Villy Sundström
  • Arkady Yartsev

Summary, in English

We measure the transient photocurrent of APFO3:PCBM bulk heterojunction solar cells illuminated with ns-laser and sub-ms LED light sources. The ratio of the number of collective charges to the number of excited photon (external quantum efficiency, EQE) and the transient photocurrent fall times have been carried out with difference pulse durations and fluences. The EQEs characterized by ns-laser source are shown to obey the bimolecular recombination at high excitation fluences. The increasing of transient photocurrent fall times suggests that the fall times of free charge carriers are effected by deep trap density of state (DoS) and thus the free charge carriers have a sufficient time for bimolecular recombination at short circuit condition. At the same fluences, however, the EQEs characterized by sub-ms LED sources exhibit an excitation fluences independence of EQE. The transient photocurrent fall times with sub-ms LED sources are rather constant when the excitation fluences increases indicating that the deep trap DoS has less effect at short circuit condition for longer pulse duration.

Department/s

  • Chemical Physics
  • NanoLund: Center for Nanoscience

Publishing year

2015

Language

English

Publication/Series

Proceedings of SPIE

Volume

9659

Document type

Conference paper

Publisher

SPIE

Topic

  • Physical Chemistry
  • Energy Systems

Keywords

  • Transient photocurrent
  • Organic Solar Cells
  • Bulk heterojunction
  • APFO3

Conference name

International Conference on Photonics Solutions (ICPS)

Conference date

2015-07-06 - 2015-07-08

Conference place

Hua Hin, Thailand

Status

Published

ISBN/ISSN/Other

  • ISSN: 0277-786X
  • ISSN: 1996-756X