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SUMMARY:First Nordic Sub-Micron IR Microscopy Conference
DESCRIPTION:Contact: josefin.martell@linxs.lu.se\n\nInfrared (IR) spectrosc
 opy is a highly sensitive analytical technique with high spectral resoluti
 on\, enabling the detection of subtle molecular variations and providing d
 etailed chemical fingerprinting in complex samples. For years\, the method
  has therefore been popular in a wide range of scientific fields\, from ch
 emistry and material science to environmental and biomedical studies. In c
 onventional IR microscopy\, however\, the lateral resolution is limited by
  the diffraction limit of the wavelength of the IR light\, which is severa
 l (tens of) microns.&nbsp\;In the last 15-20 years\, however\, new develop
 ments have circumvented these boundaries by employing the photothermal eff
 ect in a clever way: thermal expansion induced by the absorption of IR las
 er light is detected by a different probe\, that is not subject to the sam
 e spatial limitation. In optical photothermal IR (O-PTIR) microscopy this 
 is done via an optical probe laser\, whereas atomic force microscopy (AFM-
 IR) uses mechanical sensing via the AFM-tip. This has brought the spatial 
 resolution of IR microscopy down to sub-micron scales - even all the way d
 own to 10 nm for the AFM-IR! Understandably\, this has opened up a whole n
 ew area of possibilities: from characterizing polymer blends and identifyi
 ng microplastics to visualizing intracellular biochemical organization in 
 both prokaryotic and eukaryotic cells.To bring together researchers and in
 strument developers at the forefront of this rapidly evolving field\, we a
 re excited to announce the First Nordic Sub-Micron IR Microscopy Conferenc
 e\, taking place in Lund\, Sweden\, this autumn.&nbsp\;&nbsp\;This event w
 ill serve as a dynamic platform to explore the latest advances in high-res
 olution IR techniques\, with a special focus on O-PTIR\, AFM-IR\, as well 
 as multi-modal approaches\, including X-ray microscopy. We further aim to 
 strengthen collaborations among researchers within this field in the Nordi
 c countries\, and further afield.&nbsp\;Over three days of invited and con
 tributed talks\, poster presentations\, and a demo session at the AFM-IR i
 nstrument placed at MAX IV Laboratory\, participants will have the opportu
 nity to:●&nbsp\;&nbsp\;&nbsp\;&nbsp\;&nbsp\; Explore cutting-edge applic
 ations in materials research\, environmental and biomedical science●&nbs
 p\;&nbsp\;&nbsp\;&nbsp\;&nbsp\; Deepen their understanding of instrumentat
 ion\, data interpretation\, and correlative/complementary techniques●&nb
 sp\;&nbsp\;&nbsp\;&nbsp\;&nbsp\; Network with leading experts and fellow r
 esearchers to share insights and spark collaborationsFull program\, keynot
 e speakers\, and registration details—coming soon HERE\n\nMore informati
 on about the event: https://www.nano.lu.se/calendar/first-nordic-sub-micro
 n-ir-microscopy-conference
DTSTART;TZID=GMT:20251015T070000
DTEND;TZID=GMT:20251017T150000
LOCATION:LINXS\, The Loop\, Rydbergs torg 4\, 224 84 Lund
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