X-ray and neutron analysis of ferroic materials

Ferromagnetic and ferroelectric materials provide key functionality in critical semiconductor technologies, including sensors, microactuators, information storage, and emerging computing concepts. Characterizing their material properties using complementary X-ray and neutron techniques is essential for further advances. This workshop, as part of the LINXS Semiconductor Theme, brings together some of the most prominent researchers in the field to share recent results and methods, foster discussion, and promote collaboration across disciplines.

You can participate in person at LINXS, or online. 

• Programme and link to registration