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Portrait of Erik Lind; Photo: Kennet Ruona

Erik Lind

Professor, Coordinator Nanoelectronics & Nanophotonics

Portrait of Erik Lind; Photo: Kennet Ruona

Resonant tunneling permeable base transistor based pulsed oscillator


  • Erik Lind
  • Peter Lindström
  • André Nauen
  • Lars-Erik Wernersson

Summary, in English

A technology was developed to embed nm-sized metallic features in close vicinity to semiconductor heterostructures, which allows a direct integration of resonant tunneling diodes (RTD) inside the channel of permeable base transistor. A AlGaAs/InGaAs based RTD was grown by molecular beam epitaxy (MBE), with peak current density either 70 or 120 kA/cm<sup>2</sup>. A fundamental oscillation frequency of 800 MHz was detected, with higher harmonics up to 2.6 GHz, using a spectrum analyzer. It was found that the oscillations could be quenched by applying a large (-1.5V) negative gate bias. The results indicate that a three terminal resonant tunneling transistor can be used to obtain pulsed operation of a resonant tunneling based oscillator.


  • Department of Electrical and Information Technology
  • Solid State Physics

Publishing year







Device Research Conference - Conference Digest, DRC

Document type

Conference paper


IEEE - Institute of Electrical and Electronics Engineers Inc.


  • Condensed Matter Physics
  • Electrical Engineering, Electronic Engineering, Information Engineering


  • Peak-current density
  • Gate capacitance
  • Resonant tunneling diodes (RTD)
  • Resonant tunneling permeable based transistor (RT0PBT)

Conference name

Device Research Conference - Conference Digest, 62nd DRC

Conference date

2004-06-21 - 2004-06-23

Conference place

Notre Dame, IN, United States




  • ISSN: 1548-3770