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Workshop on Characterization Techniques at NanoLund

Seminar & Workshop

At NanoLund, we are using a large variety of excellent characterization techniques. But which techniques are available, what can they do, who is the contact person, and how can my research gain from complementary methods? In this workshop, experts from different areas in NanoLund will introduce their characterization techniques, and we will learn from each other how to broaden our experimental possibilities by complementary techniques.

Preliminary Agenda

 

 Welcome and introduction Rainer Timm

14.00 Characterization of charge carrier dynamics in semiconductors
Arkady Yartsev

14.20 Multidimensional optical spectroscopy and time-resolved photoemission electron microscopy
Donatas Zigmantas

14.35 Luminescence microscope as a multi-functional spectroscopy platform for material science
Ivan Scheblykin

15.55 Imaging and spectroscopy tools to be used with advanced light sources
Anders Mikkelsen

15.15 coffee break

15.35 Atomic and electronic surface structure studied by STM and AFM
Rainer Timm

15.50 Metrology tools in the NanoLab (SEM, EDS, EBSD, XRD, ellipsometer, …)
Peter Blomqvist

16.10 Cathodoluminescence microscopy
Asmita Jash

16.25 Stimulated emission depletion (STED) super-resolution microscopy
Jason Beech

16.45 Concluding discussion
Rainer Timm and Donatas Zigmantas

Time: 
22 October 2020 14:00 to 17:00
Location: 
k-space and Zoom. Zoom-link will be mailed to all in NanoLund before the workshop
Contact: 
rainer.timm [at] sljus.lu.se

About the event

Time: 
22 October 2020 14:00 to 17:00
Location: 
k-space and Zoom. Zoom-link will be mailed to all in NanoLund before the workshop
Contact: 
rainer.timm [at] sljus.lu.se