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Scanning Probe Microscopy

Lund University Scanning Probe Microscopy Facility (LUSP) mainly builds on scanning tunneling microscopy and spectroscopy (STM) and atomic force microscopy (AFM). Experiments can be performed in ultrahigh vacuum conditions (UHV), in air, and in liquids (with AFM).
Research focuses on the surface characterization of semiconductor nanostructures, catalytically active materials, and two-dimensional materials, but also includes other types of samples. Correlation of structural, mechanical, and electronic properties across interfaces and heterostructures of technologically relevant materials at the atomic scale is one of the driving goals.

Anders Mikkelsen is checking a sample in the vacuum chamber of the Scanning Probe Microscope. Photo: Mikael Risedal Anders Mikkelsen is checking a sample in the vacuum chamber of the Scanning Probe Microscope. Photo: Mikael Risedal

The facility is managed by the Division of Synchrotron Radiation Research.
More information about available microscopes on the Lund University Scanning Probe Microscopy Facility (LUSP) website.

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Contact

Anders Mikkelsen; email: anders [dot] mikkelsen [at] sljus [dot] lu [dot] se

Rainer Timm;  email:  rainer [dot] timm [at] sljus [dot] lu [dot] se

Edvin Lundgren; email: edvin [dot] lundgren [at] sljus [dot] lu [dot] se

Jan Knudsen; email: jan [dot] knudsen [at] maxiv [dot] lu [dot] se

Johan Gustafson; email: johan [dot] gustafson [at] sljus [dot] lu [dot] se

Joachim Schnadt; email: joachim [dot] schnadt [at] sljus [dot] lu [dot] se