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Portrait of Ivan Maximov. Photo: Kennet Ruona

Ivan Maximov

Associate Professor, Coordinator Exploratory Nanotechnology

Portrait of Ivan Maximov. Photo: Kennet Ruona

The c-axis thermal conductivity of graphite film of nanometer thickness measured by time resolved X-ray diffraction

Author

  • Maher Harb
  • Clemens von Korff Schmising
  • Henrik Enquist
  • Andrius Jurgilaitis
  • Ivan Maximov
  • P. V. Shvets
  • A. N. Obraztsov
  • D. Khakhulin
  • M. Wulff
  • Jörgen Larsson

Summary, in English

We report on the use of time resolved X-ray diffraction to measure the dynamics of strain in laser-excited graphite film of nanometer thickness, obtained by chemical vapour deposition (CVD). Heat transport in the CVD film is simulated with a 1-dimensional heat diffusion model. We find the experimental data to be consistent with a c-axis thermal conductivity of similar to 0.7 Wm(-1) K-1. This value is four orders of magnitude lower than the thermal conductivity in-plane, confirming recent theoretical calculations of the thermal conductivity of multilayer graphene. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4769214]

Department/s

  • Atomic Physics
  • Solid State Physics
  • NanoLund

Publishing year

2012

Language

English

Publication/Series

Applied Physics Letters

Volume

101

Issue

23

Document type

Journal article

Publisher

American Institute of Physics (AIP)

Topic

  • Condensed Matter Physics
  • Atom and Molecular Physics and Optics

Status

Published

ISBN/ISSN/Other

  • ISSN: 0003-6951