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Portrait of Jonas Tegenfeldt. Photo: Kennet Ruona

Jonas Tegenfeldt

Professor, Coordinator Nanobiology & Neuronanoscience

Portrait of Jonas Tegenfeldt. Photo: Kennet Ruona

Image widening not only a question of tip sample convolution

Author

  • Jonas O. Tegenfeldt
  • Lars Montelius

Summary, in English

As the tip in the atomic force microscope is scanned over the sample surface an image results which contains information from the sample as well as from the tip. This mainly results in an increase of the apparent size of the sample. If the tip is reasonably sharp the contribution from the tip is small. In some cases the widening still persists in spite of a very sharp tip. In this letter, a model is presented which ascribes this to the lateral forces twisting the cantilever giving an offset between the apparent point of contact and the real point of contact. This results in a shift between forward and reverse scan of the sample position in the imaging window and, if the lateral forces due to the sample and substrate are different, a change in the apparent width of the sample.

Department/s

  • Solid State Physics

Publishing year

1995-12-01

Language

English

Publication/Series

Applied Physics Letters

Document type

Journal article

Publisher

American Institute of Physics (AIP)

Status

Published

ISBN/ISSN/Other

  • ISSN: 0003-6951