Your browser has javascript turned off or blocked. This will lead to some parts of our website to not work properly or at all. Turn on javascript for best performance.

The browser you are using is not supported by this website. All versions of Internet Explorer are no longer supported, either by us or Microsoft (read more here: https://www.microsoft.com/en-us/microsoft-365/windows/end-of-ie-support).

Please use a modern browser to fully experience our website, such as the newest versions of Edge, Chrome, Firefox or Safari etc.

Portrait of Jonas Tegenfeldt. Photo: Kennet Ruona

Jonas Tegenfeldt

Professor, Coordinator Nanobiology & Neuronanoscience

Portrait of Jonas Tegenfeldt. Photo: Kennet Ruona

Direct observation of the tip shape in scanning probe microscopy

Author

  • L. Montelius
  • J. O. Tegenfeldt

Summary, in English

In this study we report on the first direct observation of the real shape of the atomic force microscopy (AFM) tip using the AFM technique itself, utilizing a specially designed sample geometry. This is the first report of the so-called inverse AFM mode in which the tip is actually used as the sample and vice versa. We propose how this method can, with a very high accuracy, be used for studying objects, e.g., biomolecules, that are attached to the usual AFM cantilever tip. Finally, we discuss how this method can significantly increase the reliability of the obtained AFM images.

Department/s

  • Solid State Physics

Publishing year

1993-12-01

Language

English

Pages

2628-2630

Publication/Series

Applied Physics Letters

Volume

62

Issue

21

Document type

Journal article

Publisher

American Institute of Physics (AIP)

Topic

  • Other Physics Topics
  • Signal Processing

Status

Published

ISBN/ISSN/Other

  • ISSN: 0003-6951