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Portrait of Jonas Tegenfeldt. Photo: Kennet Ruona

Jonas Tegenfeldt

Professor, Coordinator Nanobiology & Neuronanoscience

Portrait of Jonas Tegenfeldt. Photo: Kennet Ruona

Polarization dependence of light intensity distribution near a nanometric aluminum slit

Author

  • CH Wei
  • PH Tsao
  • W Farm
  • PK Wei
  • Jonas Tegenfeldt
  • RH Austin

Summary, in English

The near-field radiation pattern of a long thin slit (with a width much smaller than the excitation wavelength) in a uniform aluminum surface was measured and modeled by numerical computation. In particular, the interplay between the incident light polarization and the slit width is found to play an essential role in the near-field profile on the back side of the nanoslits. Two-dimensional finite-difference time-domain computer simulations were performed to calculate the near-field intensity profile for different slit widths and metal thicknesses. This method will allow the optimization of three-dimensional near-field radiation patterns for a variety of near-field molecular scanning schemes. (C) 2004 Optical Society of America.

Department/s

  • Solid State Physics

Publishing year

2004

Language

English

Pages

1005-1012

Publication/Series

Optical Society of America. Journal B: Optical Physics

Volume

21

Issue

5

Document type

Journal article

Publisher

Optical Society of America

Topic

  • Condensed Matter Physics

Status

Published

ISBN/ISSN/Other

  • ISSN: 0740-3224