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Portrait of Jonas Tegenfeldt. Photo: Kennet Ruona

Jonas Tegenfeldt

Professor, Coordinator Nanobiology & Neuronanoscience

Portrait of Jonas Tegenfeldt. Photo: Kennet Ruona

Beaming effect of optical near-field in multiple metallic slits with nanometric linewidth and micrometer pitch

Author

  • P K Wei
  • H L Chou
  • Y R Cheng
  • C H Wei
  • W Fann
  • Jonas Tegenfeldt

Summary, in English

The beaming effect and interference patterns on the exit surface of multiple nano metallic slits with micrometer pitch were observed by scanning near-field optical microscopy. The near-field light intensity for multiple slits had a longer propagation tail and a smaller diverging angle as compared to that in a single slit. From finite-difference time-domain calculations, we verify that these fringe patterns come from the interference effect of longitudinal electric field, which is propagating along the surface. The beaming light in the slit openings is also attributed to the addition of longitudinal fields.

Department/s

  • Solid State Physics

Publishing year

2005

Language

English

Pages

198-204

Publication/Series

Optics Communications

Volume

253

Issue

1-3

Document type

Journal article

Publisher

Elsevier

Topic

  • Condensed Matter Physics

Keywords

  • near-field scanning optical microscopes

Status

Published

ISBN/ISSN/Other

  • ISSN: 0030-4018