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Knut Deppert

Knut Deppert

Professor

Knut Deppert

Structural Investigations of Core-shell Nanowires Using Grazing Incidence X-ray Diffraction.

Author

  • Mario Keplinger
  • Thomas Mårtensson
  • Julian Stangl
  • Eugen Wintersberger
  • Bernhard Mandl
  • Dominik Kriegner
  • Václav Holý
  • Günther Bauer
  • Knut Deppert
  • Lars Samuelson

Summary, in English

The fabrication of core-shell structures is crucial for many nanowire device concepts. For the proper tailoring of their electronic properties, control of structural parameters such as shape, size, diameter of core and shell, their chemical composition, and information on their strain fields is mandatory. Using synchrotron X-ray diffraction studies and finite element simulations, we determined the chemical composition, dimensions, and strain distribution for series of InAs/InAsP core-shell wires grown on Si(111) with systematically varied growth parameters. In particular we detect initiation of plastic relaxation of these structures with increasing shell thickness and/or increasing phosphorus content. We establish a phase diagram, defining the region of parameters leading to pseudomorphic nanowire growth. This is important to avoid extended defects which are detrimental for their electronic properties.

Department/s

  • Solid State Physics

Publishing year

2009

Language

English

Pages

1877-1882

Publication/Series

Nano Letters

Volume

9

Issue

5

Document type

Journal article

Publisher

The American Chemical Society (ACS)

Topic

  • Nano Technology

Status

Published

ISBN/ISSN/Other

  • ISSN: 1530-6992