Your browser has javascript turned off or blocked. This will lead to some parts of our website to not work properly or at all. Turn on javascript for best performance.

The browser you are using is not supported by this website. All versions of Internet Explorer are no longer supported, either by us or Microsoft (read more here: https://www.microsoft.com/en-us/microsoft-365/windows/end-of-ie-support).

Please use a modern browser to fully experience our website, such as the newest versions of Edge, Chrome, Firefox or Safari etc.

Knut Deppert

Knut Deppert

Professor

Knut Deppert

Direct observation of the molten state of nanometer-sized particles with an atomic force microscope: A feasibility study

Author

  • S Ismail
  • Knut Deppert
  • T Junno
  • Carl Kortegaard
  • H Larne
  • MH Magnusson
  • Claes Thelander
  • Lars Samuelson

Summary, in English

An atomic force microscope (AFM) was used to directly examine the physical state of nanometer-sized particles. The critical diameter of indium particles, where evidence of melting at room temperature was observed, was 7.8 +/- 1.2 nm. This conclusion is based on a method relying on the manipulation of particles in ambient air and at constant temperature. This method involves a simple set-up that permits a combination of both manipulation and imaging of individual particles. To determine whether a particle is molten, three criteria are used: the merging of particles to form bigger spherical particles, a tip-induced shape change, and the formation of nanofibers. All three criteria have been checked using other particle materials. An attempt at 56degreesC revealed oxidation of the indium particles as the major problem for melting investigation. Manipulations under high-purity nitrogen atmosphere support the validity of the findings. The use of the AFM to determine whether a nanoparticle is molten is, however, complicated by the oxidation issue.

Department/s

  • Solid State Physics

Publishing year

2002

Language

English

Pages

351-356

Publication/Series

Journal of Nanoparticle Research

Volume

4

Issue

4

Document type

Journal article

Publisher

Springer

Topic

  • Nano Technology

Keywords

  • atomic force microscope
  • melting point
  • nanoparticles

Status

Published

ISBN/ISSN/Other

  • ISSN: 1572-896X