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Portrait of Reine Wallenberg. Photo: Kennet Ruona

Reine Wallenberg

Professor, Coordinator Materials Science

Portrait of Reine Wallenberg. Photo: Kennet Ruona

Electron channelling : challenges and opportunities for compositional analysis of nanowires by TEM

Author

  • M. Ek
  • Sebastian Lehmann
  • Reine Wallenberg

Summary, in English

Energy dispersive x-ray spectroscopy in a transmission electron microscope is often the first method employed to characterize the composition of nanowires. Ideally, it should be accurate and sensitive down to fractions of an atomic percent, and quantification results are often reported as such. However, one can often get substantial errors in accuracy even though the precision is high: for nanowires it is common for the quantified V/III atomic ratios to differ noticeably from 1. Here we analyse the origin of this systematic error in accuracy for quantification of the composition of III-V nanowires. By varying the electron illumination direction, we find electron channelling to be the primary cause, being responsible for errors in quantified V/III atomic ratio of 50%. Knowing the source of the systematic errors is required for applying appropriate corrections. Lastly, we show how channelling effects can provide information on the crystallographic position of dopants.

Department/s

  • Centre for Analysis and Synthesis
  • NanoLund
  • Solid State Physics

Publishing year

2020

Language

English

Publication/Series

Nanotechnology

Volume

31

Issue

36

Document type

Journal article

Publisher

IOP Publishing

Topic

  • Materials Chemistry
  • Nano Technology

Status

Published

ISBN/ISSN/Other

  • ISSN: 0957-4484