The browser you are using is not supported by this website. All versions of Internet Explorer are no longer supported, either by us or Microsoft (read more here:

Please use a modern browser to fully experience our website, such as the newest versions of Edge, Chrome, Firefox or Safari etc.

Software resources for nanowire contacting and electrical measurements

How to make contacts to randomly placed objects?

Here I present an overview of the LabVIEW software I have developed that helps us to accurately and reproducibly fabricate contacts to nanowires randomly dispersed on a sample. It is used by many researchers working with transport measurements, transistor characterization, 4-probe measurements, Hall measurements, thermoelectric characterization etc.

Nanowire contact process

The figure series show some steps involved in the transfer and contacting process.

Below is a link to a pdf presentation (from Nordic Nanolab User Meeting 2022) where I explain our process for sample preparation based on the software, followed by a short video that demonstrates some functions of the software (which should have been played inside the presentation).

Video demonstration:


Software for electrical characterization and analysis

In the pdf document below, I give an introduction to the LabVIEW software that many of us are using for transport measurements in research and teaching. The idea behind the software is to have a simple and user-friendly interface that works in multiple settings, from sensitive transport characterization at mK temperatures, to various transistor metrics extraction.

front panel

A screenshot of the control panel in the measurement program.